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Proceedings Paper

Study of Multilayered X-UV Polarizers and Consequence of the Use of Partially Polarized Light on Absolute Reflectivity Measurements
Author(s): A. Khandar; P. Dhez; M. Berland
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Paper Abstract

An X-UV polarimeter with a rotating 45° angle of incidence multilayer as polarizer has been built and used to measure the polarization rates of the 154A and 304A light after monochromators. Due to the good polarization of the synchrotron source, polarization rates around of 70% have been measured.

Paper Details

Date Published: 9 April 1987
PDF: 8 pages
Proc. SPIE 0688, Multilayer Structures & Laboratory X-Ray Laser Research, (9 April 1987); doi: 10.1117/12.964841
Show Author Affiliations
A. Khandar, Universite Paris XI (France)
P. Dhez, Universite Paris XI (France)
M. Berland, Universite Paris XI (France)

Published in SPIE Proceedings Vol. 0688:
Multilayer Structures & Laboratory X-Ray Laser Research
Natale M. Ceglio; Pierre Dhez, Editor(s)

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