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Proceedings Paper

Targeting Systems Characterization Facility
Author(s): Charles E. Lucius; Drexel G. Waggoner
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Paper Abstract

For nearly five years, the Air Force Avionics Laboratory has operated the Targeting Systems Characterization Facility (TSCF) at Wright-Patterson Air Force Base, Ohio. This has resulted in an extremely large amount of archived data describing the performance of an infrared sensor, the target and backgrounds observed by the sensor, and the environmental conditions occurring during the measurement periods. Since these data are stored in a digital computer in a rigid format, they can be efficiently and conveniently accessed. The TSCF data are available to the sensor community and have proven to be a valuable asset in the development and validation of the Research Grade Infrared Tactical Decision Aid, and in the investigation of environmental influences on infrared sensor performance. This paper describes the Targeting Systems Characterization Facility itself and demonstrates the usefulness of the data. Emphasis is placed on the measurement procedures and instrumentation used for the data collection. The preparation of this paper is sponsored by the Air Force Avionics Laboratory.

Paper Details

Date Published: 5 August 1986
PDF: 8 pages
Proc. SPIE 0636, Thermal Imaging, (5 August 1986); doi: 10.1117/12.964195
Show Author Affiliations
Charles E. Lucius, Battelle Columbus Laboratories (United States)
Drexel G. Waggoner, U.S. Air Force Avionics Laboratory (United States)

Published in SPIE Proceedings Vol. 0636:
Thermal Imaging
Irving R. Abel, Editor(s)

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