Share Email Print

Proceedings Paper

A Video Processing System Capable of Performing Coherence Length Measurements and Characterization of Fiber-Coupled Laser Diodes
Author(s): Peter L. Fuhr; Betty Lise Anderson; Paul W. Pastel; Thomas A. Maufer
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The increasing interest in fiber optic communication and sensor systems utilizing interferometric detection of optical fields has made accurate determination of the light field's coherence parameters more important. We have developed a computer based measurement system which allows for video frame grabbing of Michelson interferometer output beams. Key attributes of this system are that it uses a standard non-dedicated microcomputer (Macintosh II) and relatively inexpensive commercially available software and frame acquisition hardware. Video frames are acquired and simply processed allowing fringe contrast to be easily determined, from which coherence length may be found. While the system described here is capable of performing optical contrast measurements of any field illuminating the video sensor array, its primary use in our facility has been to examine coherence of laser diodes that have been coupled into various types of single and multimode optical fiber. In addition, the system has been used to determine laser diode coherence length as the diode was subjected to various biasing conditions. Such measurements will be presented as will a complete description of the entire system.

Paper Details

Date Published: 23 January 1990
PDF: 8 pages
Proc. SPIE 1180, Tests, Measurements, and Characterization of Electro-Optic Devices and Systems, (23 January 1990); doi: 10.1117/12.963467
Show Author Affiliations
Peter L. Fuhr, University of Vermont (United States)
Betty Lise Anderson, University of Vermont (United States)
Paul W. Pastel, University of Vermont (United States)
Thomas A. Maufer, University of Vermont (United States)

Published in SPIE Proceedings Vol. 1180:
Tests, Measurements, and Characterization of Electro-Optic Devices and Systems
Shekhar G. Wadekar, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?