Share Email Print

Proceedings Paper

Characterization Of Laser Diode Intensity Noise At Microwave Frequencies With High Sensitivity
Author(s): Mario Puleo; Piero Gambini; Emilio Vezzoni
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A measurement technique has been developed, that allows the accurate characterization of laser diode intensity noise up to microwave frequencies, with high sensitivity. Relative intensity noise levels lower than 10-15 Hz-1 can be measured, with good accuracy, up to 10 GHz. Several examples are presented, showing the effects of reflections on laser noise.

Paper Details

Date Published: 5 February 1990
PDF: 9 pages
Proc. SPIE 1175, Coherent Lightwave Communications: Fourth in a Series, (5 February 1990); doi: 10.1117/12.963263
Show Author Affiliations
Mario Puleo, CSELT (Italy)
Piero Gambini, CSELT (Italy)
Emilio Vezzoni, CSELT (Italy)

Published in SPIE Proceedings Vol. 1175:
Coherent Lightwave Communications: Fourth in a Series
Roger C. Steele; Harish R. Sunak, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?