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Proceedings Paper

Analysis Of Spatial Pseudodepolarizers In Imaging Systems
Author(s): James P. McGuire Jr.; Russell A. Chipman
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Paper Abstract

The objective of a number of optical instruments is to measure the intensity accurately without bias to incident polarization state. One method to overcome polarization bias in optical systems is the insertion of a spatial pseudodepolarizer. Both the degree of pseudodepolarization and image degradation (from the polarization aberrations of the pseudodepolarizer) are analyzed for two depolarizer designs: the Cornu pseudodepolarizer effective for linearly polarized light and the dual Babinet compensator pseudodepolarizer effective for all incident polarization states. The image analysis uses the matrix formalism presented in a previous paper ("Diffraction image formation and analysis in optical systems with polarization aberrations I: Formulation and example") to describe the polarization dependence of the the diffraction patterns and optical transfer function.

Paper Details

Date Published: 25 January 1990
PDF: 14 pages
Proc. SPIE 1166, Polarization Considerations for Optical Systems II, (25 January 1990); doi: 10.1117/12.962882
Show Author Affiliations
James P. McGuire Jr., University of Alabama in Huntsville (United States)
Russell A. Chipman, University of Alabama in Huntsville (United States)

Published in SPIE Proceedings Vol. 1166:
Polarization Considerations for Optical Systems II
Russell A. Chipman, Editor(s)

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