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Proceedings Paper

Dark Field Photographic Techniques For Documenting Optical Surface Contamination.
Author(s): Kenneth M. Aline; James A. Dowdall
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Paper Abstract

Recent developments in the manufacture of flight hardware have created a demand for new techniques for contamination measurements on optical surfaces. The stringent cleanliness requirements imposed by working with these optics prohibit traditional contamination testing. The handling of optical hardware restricts contamination inspection by standard procedures. In order to view and document surface cleanliness, new photographic techniques have been pushed to their limits to record the image of light scattered from particulate contamination on optical surfaces.

Paper Details

Date Published: 2 January 1990
PDF: 5 pages
Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); doi: 10.1117/12.962868
Show Author Affiliations
Kenneth M. Aline, Lockheed Missiles and Space Company, Inc. (United States)
James A. Dowdall, Lockheed Missiles and Space Company, Inc. (United States)

Published in SPIE Proceedings Vol. 1165:
Scatter from Optical Components
John C. Stover, Editor(s)

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