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Proceedings Paper

Suppression Of Tool Marks To Enhance Detection Of Surface Defects
Author(s): C. W. Carroll; N. W.H. Sufi; R. C. Chang
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Paper Abstract

Where surface quality is crucial, metal manufacturers employ surface inspection systems that use image processing techniques to distinguish defects from normal background. These systems are well suited for surfaces in which the defects are characterized by sharp variations in intensity from the average background intensity. However, in the presence of tool marks, the ability of the surface inspection systems to distinguish defects from normal background is severely degraded. This paper presents techniques based on optical/image processing concepts to suppress the tool-marks and thereby enhance the detectability of surface defects.

Paper Details

Date Published: 20 December 1989
PDF: 10 pages
Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); doi: 10.1117/12.962825
Show Author Affiliations
C. W. Carroll, Mellon Institute (United States)
N. W.H. Sufi, Alcoa Laboratories (United States)
R. C. Chang, Alcoa Laboratories (United States)

Published in SPIE Proceedings Vol. 1164:
Surface Characterization and Testing II
John E. Greivenkamp; Matthew Young, Editor(s)

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