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Proceedings Paper

Current State Of The Art In Filter And Thin Film Performance For Extreme Ultraviolet And X-Ray Research
Author(s): Forbes Powell
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Paper Abstract

Much work has been done to characterize materials which can be used for filters in the vacuum ultraviolet and X-ray region of the electromagnetic spectrum from about 1500A down to 10Å more or less. This paper compiles and compares the results of different measurement programs, including very recent work which better quantifies transmission as a function of wavelength for various filter and window materials. Of particular interest is some correlated data on Lexan with empirically derived linear absorption coefficients as a function of wavelength and some recent data on the effect of aging on aluminum filters. Also included are some test data and comments on recent efforts to use composite materials to design or adjust the bandpass of a filter to meet particular research requirements. In addition, there are some comments on the development of thin film materials for other uses such as in photocathodes and laser targets. As a result of the combined work reported here, data is made available which will make it easier to specify and predict the performance of filters and windows for specific applications.

Paper Details

Date Published: 28 July 1989
PDF: 12 pages
Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); doi: 10.1117/12.962625
Show Author Affiliations
Forbes Powell, Luxel Corporation (United States)

Published in SPIE Proceedings Vol. 1160:
X-Ray/EUV Optics for Astronomy and Microscopy
Richard B. Hoover, Editor(s)

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