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Proceedings Paper

Detection Of Tiny Scratches And Cracks On Crystal Under Microscope With Pc-Based Image Processing System
Author(s): Sing T Bow; Ting Chen
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Paper Abstract

Detection of scratches and cracks is a key problem in the quality assurance in crystal production. difficulties in these inspections are due to the fact that such defects are so thin and short that they are almost indiscernible from the textural background of the crystal unless a special illumination and torsional viewing mechanism are provided. The purpose of this paper is to propose an effective method to automatically segment a microscopic image into separate textural structures, and eventually delineate on the quartz blanks their boundaries which show the locations of the cracks and also the scratches.

Paper Details

Date Published: 30 January 1990
PDF: 8 pages
Proc. SPIE 1153, Applications of Digital Image Processing XII, (30 January 1990);
Show Author Affiliations
Sing T Bow, Northern Illinois University (United States)
Ting Chen, Northern Illinois University (United States)


Published in SPIE Proceedings Vol. 1153:
Applications of Digital Image Processing XII
Andrew G. Tescher, Editor(s)

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