Proceedings Paper
Characterization Of X-Ray Optics By Synchrotrcn Radiation| Format | Member Price | Non-Member Price |
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Paper Abstract
A reflectometer has been set up at the radiometric laboratory of the Physikalisch-Technische Bundesanstalt at the electron storage ring BESSY. The reflectometer is used in connection with a toroidal grating monochromator and operates primarily in the wavelength range from 5 nm to 40 nm. The instrumentation is described and examples are given for the characterization of multilayer mirrors and transmission gratings.
Paper Details
Date Published: 27 November 1989
PDF: 6 pages
Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); doi: 10.1117/12.961827
Published in SPIE Proceedings Vol. 1140:
X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation
Rene Benattar, Editor(s)
PDF: 6 pages
Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); doi: 10.1117/12.961827
Show Author Affiliations
M. Kuhne, Institut Berlin (Germany)
P. Muller, Institut Berlin (Germany)
Published in SPIE Proceedings Vol. 1140:
X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation
Rene Benattar, Editor(s)
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