Share Email Print

Proceedings Paper

Buried Optical Guide Formation
Author(s): G. De Marchi; P. Mazzoldi; G. Battaglin; A. Valentini; M. Gaudio; A. Losacco; A. Miotello; R. Dal Maschio
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A systematic study of the mechanisms which govern the in-depth migration of Ag ions in glasses, in presence of an external field, has been performed, with the aim to create buried waveguides. Ag films, from 60 to 240nm thick, were evaporated on the surface of glasses of different composition. Electric fields ranging from 300 to 1000 V/cm, were applied across the glasses for different times and temperatures. The Ag distribution and glass composition modifications were analyzed using nuclear techniques, as RBS and NRA. Stresses induced by the process were investigated using mechanical microindentation techniques. A comparison between theoretical and experimental profiles has been performed and the importance of the different parameters (electric field, glass temperature, Ag surface layer thickness, process duration) was enlighted.

Paper Details

Date Published: 21 December 1989
PDF: 7 pages
Proc. SPIE 1128, Glasses for Optoelectronics, (21 December 1989); doi: 10.1117/12.961445
Show Author Affiliations
G. De Marchi, GNSM-CISM (Italy)
P. Mazzoldi, GNSM-CISM (Italy)
G. Battaglin, GNSM-CISM (Italy)
A. Valentini, Department of Physics (Italy)
M. Gaudio, Strada Provinciale per Casamassima (Italy)
A. Losacco, Strada Provinciale per Casamassima (Italy)
A. Miotello, Department of Physics (Italy)
R. Dal Maschio, Department of Engineering (Italy)

Published in SPIE Proceedings Vol. 1128:
Glasses for Optoelectronics
Giancarlo C. Righini, Editor(s)

© SPIE. Terms of Use
Back to Top