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Proceedings Paper

Ellipsometric Study Of The Optical Anisotropy Of The Plumbum Arachidate Langmuir Films
Author(s): A . Y. Tronin; A. F. Konstantinova
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Paper Abstract

The reflection matrix of plumbum arachidate Langmuir films on silicon was measured by means of the generalized ellipsometric technique. The lateral anisotropy of the films was shown. The problem of light reflection from uniaxial film on isotropic substrate with arbitrary axis orientation was solved and used for the measurment interpretation. A simple generalized ellipsometric technique for measuring the nondiagonal reflection matrix of weak anisotropic medium is described. Film refraction indices, monolayer thickness and the angle between the optical axis of the film and the normal to the surface were determined. Models of molecular packing with lateral anisotropy are discussed. Difference in wetting angle of odd and even monolayers is supposed to be the origin of the noncentrosymmetric structure of bilayer resulting in lateral anisotropy of the film.

Paper Details

Date Published: 8 January 1990
PDF: 10 pages
Proc. SPIE 1125, Thin Films in Optics, (8 January 1990); doi: 10.1117/12.961367
Show Author Affiliations
A . Y. Tronin, Institute of Crystallography (USSR)
A. F. Konstantinova, Institute of Crystallography (USSR)

Published in SPIE Proceedings Vol. 1125:
Thin Films in Optics
Theo T. Tschudi, Editor(s)

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