Share Email Print

Proceedings Paper

Thickness Measurement Using Scanned Attenuated Total Reflection Technique
Author(s): Jin-Chyuan Chen; Ding-Liang Chiao; Chien Chou
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

An improved method for determining the thin film thickness in terms of the variation of reflectivity in Attenuated Total Reflection (ATR) is proposed. In which, the correlation of the difference of thin film thickness (1d) and reflectivity (R) is derived on the basis of Fresnel's formula. In addition, a scanning unit is specially designed to scan the laser beam and detector synchronously. Experimental results indicate that the measurement accuracy is not affected by small fluctuation of the incident angle and the reflectivity change. Moreover, possible applications of this technique in developing the displacement sensor with high sensitivity are also suggested.

Paper Details

Date Published: 5 August 1986
PDF: 6 pages
Proc. SPIE 0621, Manufacturing Applications of Lasers, (5 August 1986); doi: 10.1117/12.961157
Show Author Affiliations
Jin-Chyuan Chen, Chung Cheng institute of Technology (China)
Ding-Liang Chiao, Chung Cheng institute of Technology (China)
Chien Chou, Chung Cheng institute of Technology (China)

Published in SPIE Proceedings Vol. 0621:
Manufacturing Applications of Lasers
Peter K. Cheo, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?