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Proceedings Paper

Prediction Of Image Quality Through The Atmosphere As A Function Of Weather Forecast
Author(s): N. S. Kopeika; I. Kogan; R. Israeli; I. Dinstein
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Paper Abstract

Using atmospheric modulation contrast function area (mcfa) as a single-valued numerical criterion for image quality propagated through the atmosphere, a statistical study of atmospheric imaging data has led to the determination of regression coefficients with which to quantitatively predict at visible and near infrared wavelengths effects of windspeed, air temperature, and relative humidity on image quality propagated through the atmosphere as functions of wavelength and of spatial frequency. Utilization of this procedure is quite simple. One simply plugs in expected values for windspeed, air temperature, and relative humidity in the regression coefficient expression for mcfa. The larger the expected mcfa, the better the expected image quality. Models are presented for desert and non-desert atmospheres. Preliminary experimentation indicates the accuracy of the models is quite good and that the quality of image propagation through the atmosphere can be described as a simple function of some basic meteorological dependences previously unknown. These fundamental meteorolgical parameters are part of weather forecasts measured world-wide, are simple and inexpensive to measure and can be used to determine also overall atmospheric modulation contrast function as a function of spatial frequency and meteorological conditions. An important advantage of this new approach is its simplicity as well as accuracy.

Paper Details

Date Published: 11 October 1989
PDF: 12 pages
Proc. SPIE 1115, Propagation Engineering, (11 October 1989);
Show Author Affiliations
N. S. Kopeika, Ben-Gurion University of the Negev (Israel)
I. Kogan, Ben-Gurion University of the Negev (Israel)
R. Israeli, Ben-Gurion University of the Negev (Israel)
I. Dinstein, Ben-Gurion University of the Negev (Israel)

Published in SPIE Proceedings Vol. 1115:
Propagation Engineering
Norman S. Kopeika; Walter B. Miller, Editor(s)

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