Proceedings Paper
An Apparatus For Measuring The Specular Reflectance Of Optical Components At Cryogenic Temperatures| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
A unique apparatus for measuring the specular reflectance of bare and anti-reflection coated optical components, at cryogenic temperatures, has been developed through a joint effort between the Metrology Department and the Electro-Optical Center of Rockwell International Corporation's Autonetics Electronics Systems Division, in Anaheim, California. An invention disclosure for the apparatus has been filed with Rockwell.
Paper Details
Date Published: 20 September 1989
PDF: 11 pages
Proc. SPIE 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking, (20 September 1989);
Published in SPIE Proceedings Vol. 1110:
Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking
August J. Huber; Milton J. Triplett; James R. Wolverton, Editor(s)
PDF: 11 pages
Proc. SPIE 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking, (20 September 1989);
Show Author Affiliations
John F. Gerhard, Rockwell International Corporation (United States)
Ronald D. Bigelow, Rockwell International Corporation (United States)
Published in SPIE Proceedings Vol. 1110:
Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking
August J. Huber; Milton J. Triplett; James R. Wolverton, Editor(s)
© SPIE. Terms of Use
