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Proceedings Paper

An Apparatus For Measuring The Specular Reflectance Of Optical Components At Cryogenic Temperatures
Author(s): John F. Gerhard; Ronald D. Bigelow
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Paper Abstract

A unique apparatus for measuring the specular reflectance of bare and anti-reflection coated optical components, at cryogenic temperatures, has been developed through a joint effort between the Metrology Department and the Electro-Optical Center of Rockwell International Corporation's Autonetics Electronics Systems Division, in Anaheim, California. An invention disclosure for the apparatus has been filed with Rockwell.

Paper Details

Date Published: 20 September 1989
PDF: 11 pages
Proc. SPIE 1110, Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking, (20 September 1989); doi: 10.1117/12.960738
Show Author Affiliations
John F. Gerhard, Rockwell International Corporation (United States)
Ronald D. Bigelow, Rockwell International Corporation (United States)

Published in SPIE Proceedings Vol. 1110:
Imaging Infrared: Scene Simulation, Modeling, and Real Image Tracking
August J. Huber; Milton J. Triplett; James R. Wolverton, Editor(s)

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