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Proceedings Paper

Instrumentation For Detector Spectral / Spatial Uniformity Measurements
Author(s): Ronald W. Craft; Robert M. Bronson Jr.
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Paper Abstract

The information presented in this report describes an instrument which is used for precision measurements of detector spectral response and spatial response. Emphasis will be placed on detector spatial uniformity measurements. To allow spatial uniformity testing at selected wavelengths, an instrument was designed by applying existing spectral response instrumentation technology with the addition of special exit optics, a dual axis motorized positioning table, and supporting software. Supporting components consisted of a computer controlled radiometer and a monochromator with a high intensity light source attached. Spectral response is determined by measuring the wavelength response photosensitivity of a stationary specimen to the irradiance of a calibrated monochromatic light source over the wavelength range of interest at evenly spaced intervals. Data is presented in a pictorial format by graphing the RESPONSE versus the WAVELENGTH. Detector spatial response is determined by measuring the variation in photosensitivity over the surface of the test detector by moving the detector in an X,Y grid at evenly spaced intervals under a small monochromatic spot of light. Several versions of the instrument were built and test results are provided which represent data from the spatial uniformity testing of Ge, PbS, and PbSe detectors. Data acquired is presented as a 3-Dimensional surface map by plotting the RESPONSE versus the X POSITION versus the Y POSITION.

Paper Details

Date Published: 26 September 1989
PDF: 12 pages
Proc. SPIE 1109, Optical Radiation Measurements II, (26 September 1989); doi: 10.1117/12.960711
Show Author Affiliations
Ronald W. Craft, Optronic Laboratories, Inc. (United States)
Robert M. Bronson Jr., Optronic Laboratories, Inc. (United States)

Published in SPIE Proceedings Vol. 1109:
Optical Radiation Measurements II
James M. Palmer, Editor(s)

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