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Proceedings Paper

Performance And Reliability Of Lithium Niobate Integrated Optical Devices
Author(s): F. T. Stone
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Paper Abstract

The technology used to make lithium niobate waveguide devices has matured to the point where commercial devices in prototype numbers are available from a large variety of sources. Concomitantly, methodologies and data for assessing device reliability have begun to appear more frequently. The starting material, chip fabrication processes, and packaging techniques all affect device reliability and hence must be examined for their long-term effects. As of now, lithium niobate devices have operated successfully in a variety of systems for times up to two and a half years, and the prospects are excellent for demonstrating the dependability necessary to secure a role in future photonic products

Paper Details

Date Published: 26 April 1989
PDF: 12 pages
Proc. SPIE 0992, Fiber Optics Reliability: Benign and Adverse Environments II, (26 April 1989); doi: 10.1117/12.960049
Show Author Affiliations
F. T. Stone, AT&T Bell Laboratories (United States)

Published in SPIE Proceedings Vol. 0992:
Fiber Optics Reliability: Benign and Adverse Environments II
Roger A. Greenwell; Dilip K. Paul; Shekhar G. Wadekar, Editor(s)

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