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Proceedings Paper

High Resolution X-Ray Scattering Measurements For Advanced X-Ray Astrophysics Facility (AXAF)
Author(s): Martin V Zombeck; Charles C Wyman; Martin C Weisskopf
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Paper Abstract

The Advanced X-ray Astrophysics Facility (AXAF) is to be an orbiting X-ray observatory with high resolution imaging capabilities. Specific goals of 0.5 arcsecond resolution, and an encircled energy of 60% within a 1.0 arcsecond diameter circle at 2.5 keV have been established for AXAF. Imaging X-ray optics are primarily limited by scattering of the X-rays from the mirror surfaces. To ensure that the AXAF goals can be met, comprehensive X-ray scattering measurements are being conducted on a large number of flat samples. Sub-arcsecond resolution is achieved in these measurements through use of the MSFC 1000 ft X-ray calibration facility and a high spatial resolution X-ray detector. Flats of various materials, various coatings, and a range of rms surface roughness are being evaluated. Direct evaluation of surface microroughness is also provided by a variety of optical and non-optical means. This paper describes the scattering measurement program, the instrumentation used to obtain the measurements and preliminary results of measurements on several of the sample flats.

Paper Details

Date Published: 3 March 1981
PDF: 18 pages
Proc. SPIE 0257, Radiation Scattering in Optical Systems, (3 March 1981); doi: 10.1117/12.959621
Show Author Affiliations
Martin V Zombeck, Harvard/Smithsonian Center for Astrophysics (United States)
Charles C Wyman, NASA (United States)
Martin C Weisskopf, NASA (United States)

Published in SPIE Proceedings Vol. 0257:
Radiation Scattering in Optical Systems
Gary H. Hunt, Editor(s)

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