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Proceedings Paper

Examination Of Long Focal Length, High Altitude, Standoff Reconnaissance
Author(s): O. J. Smith; H. S. Lapp; H. F. Koper; W. K. Hull; P. Brookshier; H. Q. Avera
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Paper Abstract

0. J. Smith: The panel discussion will be broken into two (2) sessions. Today's session will be concerned with long focal length, high-altitude, standoff reconnaissance as a basic technique for the collection of intelligence information, and tomorrow afternoon we will be discussing the future of standoff reconnaissance and the expectations. The panelists invited to participate today represent a cross-section of the reconnaissance community. The panelists represent the U. S. Air Force, the U. S. Navy, a major airframe supplier, a camera supplier, and a supplier of equipment for ground exploitation. They are well-known experts in their respective fields.

Paper Details

Date Published: 23 December 1980
PDF: 11 pages
Proc. SPIE 0242, Long Focal Length, High Altitude Standoff Reconnaissance, (23 December 1980); doi: 10.1117/12.959257
Show Author Affiliations
O. J. Smith, CAI (United States)
H. S. Lapp, Wright-Patterson Air Force Base (United States)
H. F. Koper, Naval Air Development Center (United States)
W. K. Hull, Itek Corporation (United States)
P. Brookshier, General Dynamics Corporation (United States)
H. Q. Avera, Bausch & Lomb, Incorporated (United States)

Published in SPIE Proceedings Vol. 0242:
Long Focal Length, High Altitude Standoff Reconnaissance
Donald H. Jarvis, Editor(s)

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