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Proceedings Paper

Optical Properties Of Tellurium Films Used For Data Recording
Author(s): Gary S. Ash; Thomas H. Allen
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Paper Abstract

The complex optical index of refraction for evaporated films of tellurium has been measured using ellipsometry over the wavelength range 439 to 633 nm. Values of n and k. for the index as a function of wavelength and as a function of thickness are presented. The transmittance and reflectance of single layers of tellurium, as well as multilayer structures to be used for optical data recording media, are shown as a function of wavelength. Oxide formation of these films has also been measured, and a model for the role of oxides in altering adhesion of the films is presented.

Paper Details

Date Published: 10 September 1980
PDF: 6 pages
Proc. SPIE 0222, Laser Scanning and Recording for Advanced Image and Data Handling, (10 September 1980); doi: 10.1117/12.958647
Show Author Affiliations
Gary S. Ash, Optical Coating Laboratory, Inc. (United States)
Thomas H. Allen, Optical Coating Laboratory, Inc. (United States)

Published in SPIE Proceedings Vol. 0222:
Laser Scanning and Recording for Advanced Image and Data Handling
Albert A. Jamberdino, Editor(s)

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