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Proceedings Paper

Extended X-Ray Absorption Fine Structure (EXAFS): A Novel Probe For Local Structure Of Glassy Solids
Author(s): Joe Wong
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Paper Abstract

The extended x-ray absorption fine structure (EXAFS) is the oscillation in the absorption coefficient extending a few hundred eVs on the high energy side of an x-ray absorption edge. This mode of spectroscopy has recently been realized to be a powerful tool in probing the local atomic structure of all states of matter, particularly with the advent of intense synchrotron radiation. More importantly is the unique ability of EXAFS to probe the structure and dynamics around individual atomic species in a multi-atomic system. In this paper, the physical processes associated with the EXAFS phenomenon will be discussed. Experimental results obtained at the Stanford Synchrotron Radiation Laboratory on some oxide and metallic glasses will be presented. The local structure in these materials are elucidated using a Fourier transform technique.

Paper Details

Date Published: 27 February 1980
PDF: 9 pages
Proc. SPIE 0204, Physical Properties of Optical Materials, (27 February 1980); doi: 10.1117/12.958145
Show Author Affiliations
Joe Wong, General Electric Corporate Research and Development (United States)

Published in SPIE Proceedings Vol. 0204:
Physical Properties of Optical Materials
Roy F. Potter, Editor(s)

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