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Proceedings Paper

Comparison Of Systems For High-Speed Surface Flaw Measurement Of Cartridges
Author(s): K. L. Swinth; L. J. Kirihara; W. J. Coleman
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Paper Abstract

Instrumentation to detect surface flaws in cartridge cases has been developed for high speed on-line inspection. Scattering of light from a line focused on the case surface indicates the presence of surface flaws and the instrumentation permits rough categorization of flaws into dents and scratches. Two methods of light detection have been implemented, and the purpose of this paper is to compare these techniques. The first technique uses fiber optics to collect the scattered light and carry it to a photomultiplier tube to generate a signal, while the second technique uses solid-state diodes to produce the sig-nal. Angled surfaces such as the shoulder on the cartridge case influence the response of the fiber-optics due to the acceptance cone of the fibers. To circumvent this problem, the fibers must be judiciously positioned during manufacture of the fiber-optic bundles. The solid-state diodes do not have the limited acceptance angle and thus provide more uniform response. However, the diodes require placement of electronics on the rotating exam wheel near the detectors. The processing electronics for-both systems are identical.

Paper Details

Date Published: 29 November 1979
PDF: 6 pages
Proc. SPIE 0193, Optical Systems in Engineering I, (29 November 1979); doi: 10.1117/12.957901
Show Author Affiliations
K. L. Swinth, Pacific Northwest Laboratory (United States)
L. J. Kirihara, Pacific Northwest Laboratory (United States)
W. J. Coleman, Pacific Northwest Laboratory (United States)

Published in SPIE Proceedings Vol. 0193:
Optical Systems in Engineering I
Paul R. Yoder Jr., Editor(s)

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