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Proceedings Paper

Interferogram Analysis For Space Optics
Author(s): John S. Loomis
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Paper Abstract

Interferometry of optical surfaces, components, and systems is used extensively by the optical industry in fabrication, quality control, and system assembly and alignment. The use of digital techniques to analyze interferograms has increased in the past few years. Sophisticated analysis techniques using micro-computers may be used by even the smallest optical shop. Digital instrumentation can be used to evaluate large numbers of interferograms. Optical quality of diffraction-limited systems is bounded by the root-mean-square wavefront departure from the appropriate reference sphere. The geometric ray properties are bounded by the maximum slope of the wavefront. The specification and evaluation of space optics often rest on these properties. Both the rms wavefront and the maximum slope of the wavefront can be determined from interferometric measurements.

Paper Details

Date Published: 27 September 1979
PDF: 5 pages
Proc. SPIE 0183, Space Optics II, (27 September 1979); doi: 10.1117/12.957405
Show Author Affiliations
John S. Loomis, University of Dayton Research Institute (United States)

Published in SPIE Proceedings Vol. 0183:
Space Optics II
Charles L. Wyman, Editor(s)

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