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Proceedings Paper

Laser Electro-Optic System For Three-Dimensional (3D) Topographic Mensuration
Author(s): Bruce R. Altschuler; Martin D. Altschuler; J. Taboada
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Paper Abstract

Applications and system hardware are described for a new comparative topographic spatial mapping device. The device will remotely, automatically, and non-destructively measure any specified surface. A unique optical method, generates a well-defined orthogonal array of individual laser beams. Variable adjustment of beam pattern spatial frequency permits either wide-angle coverage of large-sized objects or high resolution capability for detailed areas. A novel programmable electro-optic filtering system encodes the beam array. A synchronized electro-optic selective wavelength scene capture system decodes and stores scene data in real-time in ambient light. The hardware described interfaces with suitable algorithms for the rapid calculation of the three-dimensional coordinates of sample points which mathematically define the surface of an object. The derived spatial coordinates of surface sample points then form a data base for numerically-controlled fabrication machines. A completely automated real-time scene acquisition and analysis capability could lead to machine interactive systems for pattern recognition, casting or mold comparisons, vector analysis of dimensional changes, and servo-controlled robot vision applications. The device can be ruggedly configured for use in surgical operatories, hazardous industries, outdoor inspection, etc.

Paper Details

Date Published: 10 October 1979
PDF: 5 pages
Proc. SPIE 0182, Imaging Applications for Automated Industrial Inspection and Assembly, (10 October 1979); doi: 10.1117/12.957388
Show Author Affiliations
Bruce R. Altschuler, USAF School of Aerospace Medicine (United States)
Martin D. Altschuler, State University of New York at Buffalo (United States)
J. Taboada, USAF School of Aerospace Medicine (United States)

Published in SPIE Proceedings Vol. 0182:
Imaging Applications for Automated Industrial Inspection and Assembly
Richard P. Kruger, Editor(s)

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