Share Email Print

Proceedings Paper

Automatic Fingerprint Identification
Author(s): K. Asai; Y. Kato,; Y. Hoshino; K. Kiji
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The present system for identifying latent fingerprints left at the scene of a crime still depends on the skill and patience of trained fingerprint technicians because of the low quality of the latent fingerprints. An image processing & feature extraction technique has been established in order to detect minutiae (ridge endings and ridge bifurcations and ridge counts useful for latent fingerprint identification. The algorithm of the latent fingerprint identification using these features has been evaluated. Each feature is detected from the gray scale image of fingerprints and described by minutiae positions, minutiae directions and interminutia ridge counts. In the latent fingerprint identification, minutiae pairs are selected according to the similarity between latent fingerprints' features and registered fingerprints' features in a file. The similarity between two fingerprints is obtained through the comparison of selected minutiae pairs. In our experiments, we attempted the feature extraction of 500 registered fingerprints and 200 latent fingerprints, and the matching between them. The experiments were carried out using a high speed microcomputer, a flying spot scanner, a color display, and a tablet unit, which con-nected with a general purpose computer system (NEAC 2200/200).

Paper Details

Date Published: 10 October 1979
PDF: 9 pages
Proc. SPIE 0182, Imaging Applications for Automated Industrial Inspection and Assembly, (10 October 1979); doi: 10.1117/12.957371
Show Author Affiliations
K. Asai, Nippon Electric Co. Ltd. (Japan)
Y. Kato,, Nippon Electric Co. Ltd. (Japan)
Y. Hoshino, Nippon Electric Co. Ltd. (Japan)
K. Kiji, Nippon Electric Co. Ltd. (Japan)

Published in SPIE Proceedings Vol. 0182:
Imaging Applications for Automated Industrial Inspection and Assembly
Richard P. Kruger, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?