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Proceedings Paper

Making Real-Time Sun Reflectance Measurements With A Microprocessor-Based Spectroradiometer
Author(s): Frederic M. Zweibaum; Emmett W. Chapelle
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Paper Abstract

A standard high-speed, field-portable spectroradiometric measurement system built around a programmable microprocessor has been adapted to the form of a Reflectometer/Comparator. In this configuration, the instrument makes passive measurements of the absolute reflectance of agricultural plant canopies over a spectral range of 0.4 to 2.5 micrometers. Realtime absolute measurements are made possible by a unique optical chopper which constantly compares the target with the sun and derives the ratio, which is the reflectance. Extensive measurements of solar reflectance from a variety of these targets have been made. The paper describes the instrumentation and measurement procedures, reviews the software programming and discusses the results.

Paper Details

Date Published: 21 September 1979
PDF: 14 pages
Proc. SPIE 0180, Real-Time Signal Processing II, (21 September 1979); doi: 10.1117/12.957336
Show Author Affiliations
Frederic M. Zweibaum, Barnes Engineering Company (United States)
Emmett W. Chapelle, NASA Goddard Space Flight Center (United States)

Published in SPIE Proceedings Vol. 0180:
Real-Time Signal Processing II
Tien F. Tao, Editor(s)

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