Share Email Print

Proceedings Paper

Measurement Of Electron Irradiation Damage To Thinned Fairchild And Texas Instruments Charge-Coupled Devices (CCDs)
Author(s): J. P. Choisser; R. O. Ginaven; G. D. Hall; H. A. Naber; R. D. Smith II; E. A. Beaver; R. G. Hier
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A Fairchild CCD211 (190X244 pixels) charge coupled device was thinned for photon and photoelectron rear-illumination experiments. Image smear due to injection of charge into the interline transfer registers was measured, and leakage current changes as a result of photoelectron irradiation were recorded. As expected, damage rates were less than 10-4 of those measured for front side irradiation. Similar damage data were taken at UCSD on the Texas Instrument 100X160 thinned array. Nearly identical damage rates were measured for the two arrays.

Paper Details

Date Published: 3 May 1979
PDF: 15 pages
Proc. SPIE 0172, Instrumentation in Astronomy III, (3 May 1979); doi: 10.1117/12.957088
Show Author Affiliations
J. P. Choisser, Electronic Vision Company (United States)
R. O. Ginaven, Electronic Vision Company (United States)
G. D. Hall, Electronic Vision Company (United States)
H. A. Naber, Electronic Vision Company (United States)
R. D. Smith II, Electronic Vision Company (United States)
E. A. Beaver, University of California (United States)
R. G. Hier, University of California (United States)

Published in SPIE Proceedings Vol. 0172:
Instrumentation in Astronomy III
David L. Crawford, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?