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Proceedings Paper

Low-Absorption Grating Beam Samplers
Author(s): Jayanta K. Guha; James A. Plascyk
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Paper Abstract

A development program involving the design, fabrication and testing of low-efficiency, low-absorption grating beam samplers is described. Two different basic designs were selected for development. The first design is a low-efficiency grating with a high reflectivity multi-layer dielectric coating. The second design is a "buried grating", which consists of a blazed grating under a ZnSe spacer layer, with a high reflectivity multilayer overcoat. The fabrication problems associated with each type of beam sampler are discussed. The comparison of experimentally measured absorptivity and efficiency with values obtained from computer cal-culations are presented. An additional effort currently underway to make very low absorptivity beam samplers by generating periodic refractive index variations in the dielectric stack is also discussed.

Paper Details

Date Published: 4 April 1979
PDF: 8 pages
Proc. SPIE 0171, Optical Components: Manufacture and Evaluation, (4 April 1979); doi: 10.1117/12.957053
Show Author Affiliations
Jayanta K. Guha, The Perkin-Elmer Corporation (United States)
James A. Plascyk, The Perkin-Elmer Corporation (United States)

Published in SPIE Proceedings Vol. 0171:
Optical Components: Manufacture and Evaluation
Donald S. Nicholson, Editor(s)

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