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Proceedings Paper

Introduction To Solid State Image Scanners
Author(s): Peter W. Fry
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Paper Abstract

Solid state image scanners are based on the generation of a pattern of charge carriers in silicon crystal when illuminated. An array of small photodiodes or depletion regions measure the carrier density, and thus the illumination, at each point. By allowing the charge carriers to collect on the photodiodes or depletion regions for a defined period, the intensity is integrated over this period. The resultant charge pattern is 'scanned', i.e. read out point-by-point at one output terminal, by one of three methods: SSPA, CID, or CCD. SSPA (Self-Scanned Photodiode Array) uses an MOST multiplexer switch driven by an MOST shift register to connect each photodiode in turn onto the output terminal. CID (Charge Injection Device) injects the charge collected on an array of depletion regions into the silicon crystal, point-by-point, by switching off the field producing the depletion. CCD (Charge Coupled Device) shifts the charge pattern from point to point across the silicon surface, between depletion regions, until it reaches the output terminal.

Paper Details

Date Published: 1 January 1978
PDF: 7 pages
Proc. SPIE 0145, Industrial Applications of Solid State Image Scanners, (1 January 1978); doi: 10.1117/12.956589
Show Author Affiliations
Peter W. Fry, The Grove Trading Estate (England)

Published in SPIE Proceedings Vol. 0145:
Industrial Applications of Solid State Image Scanners
David J. Purll, Editor(s)

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