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Proceedings Paper

Determination Of The Index Profile Of A Dielectric Plate By Optical Methods
Author(s): Andre Roger; Daniel Maystre
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Paper Abstract

We deal with an inverse scattering problem : knowing some properties of a diffracted wave, what can be said on the diffracting object ? This leads to strong mathematical difficulties. Using new methods, we show it is possible, for instance, to deduce the index profile of an inhomogeneous plate from its reflection coefficient.

Paper Details

Date Published: 18 April 1978
PDF: 3 pages
Proc. SPIE 0136, 1st European Conf on Optics Applied to Metrology, (18 April 1978); doi: 10.1117/12.956133
Show Author Affiliations
Andre Roger, Faculte des Sciences et Techniques (France)
Daniel Maystre, Faculte des Sciences et Techniques (France)

Published in SPIE Proceedings Vol. 0136:
1st European Conf on Optics Applied to Metrology
Michel H. Grosmann; Patrick Meyrueis, Editor(s)

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