A method is presented to determine the surface-temperature distribution at each point in an infrared picture. To handle the surface reflection problem, three cases are considered that include the use of black coatings, radiation shields, and band-pass filters. For uniform irradiation on the test surface, the irradiation can be measured using a cooled, convex mirror. Equations are derived to show that this surrounding irradiation effect can be subtracted out from the scanned radiation, thereby relating the net radiation only to emission from the surface. To provide for temperature measurements over a large field, the image-processing technique is used to digitize the infrared data. The paper spells out procedures that involve the use of a computer for making point-by-point temperature calculations. Finally, a sample case is given to illustrate applications of the method.

Date Published: 9 November 1977
PDF: 8 pages
Proc. SPIE 0124, Modern Utilization of Infrared Technology III, (9 November 1977); doi: 10.1117/12.955864

Published in SPIE Proceedings Vol. 0124:
Modern Utilization of Infrared Technology III
Irving J. Spiro, Editor(s)