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Proceedings Paper

Subpicosecond Proximity-Focused Visible Streak Camera Evaluation And Application
Author(s): Albert J. Lieber; H. Dean Sutphin; Ronald C. Hyer; John S. McGurn; Kenneth R. Winn
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Paper Abstract

Several years ago a new era in streak, cameras began with the introduction of an x-ray sensitive proximity mfocused streak tube. This device displayed. better than 3 ps resolution and a large dynamic range, making it a fundamental laser-fusion. diagnostic. The new tube is based upon parallel-photoelectron trajectories, rather than cross-over or pinhole electron optics used in virtually all other streak tubes. This eliminates a most of problems due to space charge buildup effects at the electron pinhole such as low dynamic resolution, limited dynamic range and unpredictable instrumental field distortion. In the old, tube instrumental errors are relate to distribution of photocathode illumination. in picosecond temporal application. Recently a visible variant of the proximity-focused tube design has been constructed. This camera displays all the advantages of its predecessor including high sensitivity, large dynamic range and a flat format making it ideal for digital readout. In addition, picosecond streaks of high statistical quality indicate the design limit has yet to be reached. TLe. new camera has already uncovered laser oscillator problems proving its utility as a basic laser diagnostic. Using this new "photon micrometer", a myriad. of new optical techniques such as high-accuracy three dimensional imaging are now possible.

Paper Details

Date Published: 20 October 1977
PDF: 4 pages
Proc. SPIE 0122, Advances in Laser Engineering I, (20 October 1977); doi: 10.1117/12.955778
Show Author Affiliations
Albert J. Lieber, Los Alamos Scientific Laboratory (United States)
H. Dean Sutphin, Los Alamos Scientific Laboratory (United States)
Ronald C. Hyer, Los Alamos Scientific Laboratory (United States)
John S. McGurn, Los Alamos Scientific Laboratory (United States)
Kenneth R. Winn, Los Alamos Scientific Laboratory (United States)

Published in SPIE Proceedings Vol. 0122:
Advances in Laser Engineering I
Malcolm L. Stitch; Eric J. Woodbury, Editor(s)

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