Proceedings Paper
The Curved Crystal X-Ray Spectrometer For The HEAO-B Satellite| Format | Member Price | Non-Member Price |
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Paper Abstract
The Focal Plane Crystal Spectrometer on HEAO-B is a moderate to high resolution, curved-crystal, Bragg spectrometer which operates behind a grazing incidence x-ray telescope. It is designed to allow detailed spectral studies of both point and extended celestial x-ray sources in the energy range 0.2-3.3 keV, with resolutions of 50 to 1000. The analyzing elements are six torroidal diffractors, and the detectors are position-sensitive, flow, proportional counters. HEAO-B is scheduled for launch in June, 1978.
Paper Details
Date Published: 29 August 1977
PDF: 9 pages
Proc. SPIE 0106, X-Ray Imaging, (29 August 1977);
Published in SPIE Proceedings Vol. 0106:
X-Ray Imaging
Richard P. Chase; Glenn W. Kuswa, Editor(s)
PDF: 9 pages
Proc. SPIE 0106, X-Ray Imaging, (29 August 1977);
Show Author Affiliations
C. R. Canizares, Massachusetts Institute of Technology (United States)
G. W. Clark, Massachusetts Institute of Technology (United States)
G. W. Clark, Massachusetts Institute of Technology (United States)
D. Bardas, Massachusetts Institute of Technology (United States)
T. Markert, Massachusetts Institute of Technology (United States)
T. Markert, Massachusetts Institute of Technology (United States)
Published in SPIE Proceedings Vol. 0106:
X-Ray Imaging
Richard P. Chase; Glenn W. Kuswa, Editor(s)
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