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Proceedings Paper

Pinhole Imaging Techniques For Hard X-Rays
Author(s): A. J. Toepfer; L. P. Mix; H. J. TrusselI
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Paper Abstract

Numerical image processing techniques have been applied to the restoration of x-ray pinhole photographs of solid targets irradiated by intense relativistic electron beams. An experimentally determined point spread function for the pinhole camera was utilized to eliminate the effects of high energy x-ray degradation of pin-hole resolution. Spatially resolved measurements of x-ray yield were made by measuring the dose to calibrated film and calculating the exposure using Monte-Carlo electron-photon transport calculations.

Paper Details

Date Published: 29 August 1977
PDF: 8 pages
Proc. SPIE 0106, X-Ray Imaging, (29 August 1977); doi: 10.1117/12.955455
Show Author Affiliations
A. J. Toepfer, Sandia Laboratories (United States)
L. P. Mix, Sandia Laboratories (United States)
H. J. TrusselI, Los Alamos Scientific Laboratory (United States)

Published in SPIE Proceedings Vol. 0106:
X-Ray Imaging
Richard P. Chase; Glenn W. Kuswa, Editor(s)

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