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Proceedings Paper

Increased Depth Of Focus In Scanning Microscope
Author(s): Robert L. Whitman
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Paper Abstract

A technique is described which yields an increased depth of focus in a scanning microscope system. The technique's utility for certain types of objects is demonstrated experimentally.

Paper Details

Date Published: 26 August 1977
PDF: 10 pages
Proc. SPIE 0104, Multidisciplinary Microscopy, (26 August 1977); doi: 10.1117/12.955418
Show Author Affiliations
Robert L. Whitman, Zenith Radio Corporation (United States)

Published in SPIE Proceedings Vol. 0104:
Multidisciplinary Microscopy
Robert Whitman, Editor(s)

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