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Proceedings Paper

Substrate Throughprint In Low Scatter Mirrors
Author(s): John J. Hizny
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Paper Abstract

Data is presented which details investigations of substrate throughprint in low scatter nickel plated aluminum mirrors. Effects of fabrication procedures are examined. A novel method is described for photographically recording the visible light scattering of mirror surfaces at near specular angles. Application of the technique to quantitative scatter measurement is considered. Use of the test for inprocess inspection is described.

Paper Details

Date Published: 15 January 1976
PDF: 10 pages
Proc. SPIE 0065, Design, Manufacture and Application of Metal Optics, (15 January 1976); doi: 10.1117/12.954515
Show Author Affiliations
John J. Hizny, Honeywell Radiation Ctr. (United States)

Published in SPIE Proceedings Vol. 0065:
Design, Manufacture and Application of Metal Optics
William P. Barnes Jr., Editor(s)

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