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Proceedings Paper

The Vignette Anomaly Monitor (VAM) As Applied To Automotive Testing
Author(s): C. L. Rogers Jr.
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Paper Abstract

The Vignette Anomaly Monitor or VAM is an instrument for performing non-contacting dimensional measurements. These measurements are attained by multiple evaluation of shadows produced in broad daylight or in a typical manufacturing area. The VAM is not a laboratory curiosity but is rather an instrument which has been designed for production and for installation in stringent environments. The VAM has been selected over other instruments for dimensional measurement when high frequency response was required, when immunity to scintillation was desired, where it is of advantage to have no moving parts in the measurement system, where accuracies of the order of .001 inches are required, where it is of advantage to consider the shadow rather than the object, and where a stand-off distance of up to three feet provides or permits isolation between the measured object and the measurement reference frame.

Paper Details

Date Published: 20 May 1973
PDF: 4 pages
Proc. SPIE 0034, Solving Problems in Automotive Safety Engineering and Biomechanics with Optical Instrumentation, (20 May 1973);
Show Author Affiliations
C. L. Rogers Jr., Monitor Systems Corporation (United States)

Published in SPIE Proceedings Vol. 0034:
Solving Problems in Automotive Safety Engineering and Biomechanics with Optical Instrumentation
Paul Brown; Lawrence M. Patrick, Editor(s)

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