Proceedings Paper
Radiation Effects Of Various Ion Beams On Resists Studied By Product Analysis And New Nanosecond Ion Beam Pulse Radiolysis| Format | Member Price | Non-Member Price |
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Paper Abstract
The ion beam interaction with very thin films (0.5 μm thickness) of a fundamental polymer, polystyrene, was investigated by means of radiation chemistry. Radiation effects on solubility of spin-coated polystyrene films were measured for hydrogen, helium and nitrogen ion beams (0.4 - 3.3 MeV). Measurements were also carried out for 20 keV electrons. By using ion beam pulse radiolysis system, the transient phenomena excited by energetic ion beams were investigated. The time profiles of the excimer fluorescence from ion irradiated polystyrene thin film were measured for hydrogen, helium and nitrogen ions (0.6 - 2.8 MeV). The results for energetic ions were compared with those for low LET radiation, such as fast electron or gamma-ray. Very large differences in radiation effects on solubility and some differences in transient phenomena were found and discussed from the view point of high density electronic excitation.
Paper Details
Date Published: 30 January 1989
PDF: 9 pages
Proc. SPIE 1086, Advances in Resist Technology and Processing VI, (30 January 1989); doi: 10.1117/12.953019
Published in SPIE Proceedings Vol. 1086:
Advances in Resist Technology and Processing VI
Elsa Reichmanis, Editor(s)
PDF: 9 pages
Proc. SPIE 1086, Advances in Resist Technology and Processing VI, (30 January 1989); doi: 10.1117/12.953019
Show Author Affiliations
Seiichi Tagawa, University of Tokyo (Japan)
Noriyuki Kouchi, University of Tokyo (Japan)
Noriyuki Kouchi, University of Tokyo (Japan)
Hiromi Shibata, University of Tokyo (Japan)
Yoneho Tabata, University of Tokyo (Japan)
Yoneho Tabata, University of Tokyo (Japan)
Published in SPIE Proceedings Vol. 1086:
Advances in Resist Technology and Processing VI
Elsa Reichmanis, Editor(s)
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