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Proceedings Paper

Long life 12" W-O type optical disks
Author(s): Akira Gotoh; Shuhei Nakamichi; Shinkichi Horigome
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Paper Abstract

Newly developed automated clean process has made it possible to produce 12" W-0 type optical disks with average defect rate of 3 x 10-7(1/bit). Using these disks with ultra low defect rates, accelerated life tests were performed. No disks showed any degradation in bit error rate during the high temperature and high humidity test(60°C;90%RH) of one year and the heat cycle test up to 1000 times between -40°C;3 hours and 80°C;3 hours. The acceleration coefficient for 60°C;90%RH referred to 25°C;90%RH was estimated to be more than 100.

Paper Details

Date Published: 19 May 1989
PDF: 7 pages
Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); doi: 10.1117/12.952740
Show Author Affiliations
Akira Gotoh, Hitachi Maxell, Ltd. (Japan)
Shuhei Nakamichi, Hitachi Maxell, Ltd. (Japan)
Shinkichi Horigome, Hitachi Ltd. (Japan)

Published in SPIE Proceedings Vol. 1078:
Optical Data Storage Topical Meeting
Gordon R. Knight; Clark N. Kurtz, Editor(s)

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