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Proceedings Paper

Progress of Phase-Change Single-Beam Overwrite Technology
Author(s): Motoyasu Terao; Yasushi Miyauchi; Keikichi Andoo; Hiroshi Yasuoka; Reiji Tamura
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Paper Abstract

Studies on relationships between single beam overwrite characteristics and physical and chemical properties of the phase change recording media and their mechanisms are reviewed. Improvements in overwrite characteristics based on these studies, especially improvements in carrier to noise ratio(C/N) and the life of recorded dots by the addition of one of the transition metal elements or Tt are also reported. The maximum C/N was 61dB and the estimated life of the recorded dots is longer than 100 years at 60°C.

Paper Details

Date Published: 19 May 1989
PDF: 9 pages
Proc. SPIE 1078, Optical Data Storage Topical Meeting, (19 May 1989); doi: 10.1117/12.952736
Show Author Affiliations
Motoyasu Terao, Hitachi Ltd. (Japan)
Yasushi Miyauchi, Hitachi Ltd. (Japan)
Keikichi Andoo, Hitachi Ltd. (Japan)
Hiroshi Yasuoka, Hitachi Ltd. (Japan)
Reiji Tamura, Hitachi Maxell Ltd. (Japan)

Published in SPIE Proceedings Vol. 1078:
Optical Data Storage Topical Meeting
Gordon R. Knight; Clark N. Kurtz, Editor(s)

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