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Proceedings Paper

Contouring by Electronic speckle Pattern Interferometry (ESPI)
Author(s): B. D. Bergquist; P. Montgomery
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Paper Abstract

A method of optically contouring object surfaces for inspection purposes, based on electronic speckle pattern interferometry is described. The technique forms a "bolt-on" addition to existing ESPI systems. It is shown that the correlation fringe contours thus obtained are equivalent to those of projected, two-beam interference fringe contours. Attractive features are the possibility of identifying a stationary reference contour, economy of light usage, and the possibility of programmable control of sensitivity.

Paper Details

Date Published: 16 July 1986
PDF: 7 pages
Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); doi: 10.1117/12.952374
Show Author Affiliations
B. D. Bergquist, Loughborough University of Technology (England)
P. Montgomery, Loughborough University of Technology (England)

Published in SPIE Proceedings Vol. 0599:
Optics in Engineering Measurement
William F. Fagan, Editor(s)

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