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Proceedings Paper

Real Time Detection of Spot-Type Defects
Author(s): T. J. Dennis; L. J. Clark
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Paper Abstract

A detector for low-contrast blemishes on objects with high foreground-background contrast is described. An edge detector is followed by logical shifting and expansion operations in order to locate occurrences of spatial proximity of the edge orientations and polarities expected. Maximum and minimum sizes of defect detected are adjustable.

Paper Details

Date Published: 21 April 1986
PDF: 6 pages
Proc. SPIE 0596, Architectures and Algorithms for Digital Image Processing III, (21 April 1986); doi: 10.1117/12.952304
Show Author Affiliations
T. J. Dennis, University of Essex (United Kingdom)
L. J. Clark, University of Essex (United Kingdom)

Published in SPIE Proceedings Vol. 0596:
Architectures and Algorithms for Digital Image Processing III
Francis J. Corbett; Howard Jay Siegel; Michael J. Duff, Editor(s)

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