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Proceedings Paper

On-Line Analyzer For Monitoring Trace Amounts Of Oil In Turbid Waters
Author(s): P. Niemela; J. Jaatinen
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Paper Abstract

This report presents an automated analyzer which continuously monitors oil content of a sample water stream that flows through the analyzer. The measuring principle is based on the absorption of infrared radiation by oil molecules contained in the sample water. The wavelength band that is used in the measurement is at 3.4 μm, where different types of oils show nearly equal absorption. Another wavelength band of 3.6 μm, where oil has no absorption, is used to compensate the effect of turbidity, which is due to solid particles and oil droplets contained in the sample water. Before entering the analyzer the sample water flow is properly homogenized. To compensate the strong absorption by water molecules in these wavelength bands the sample water is compared with reference water. This is done by directing them alternately through the same measuring cell. The reference water is obtained from the sample water by ultrafiltration and it determines the base line for the contaminated sample water. To ensure the stability of the base line, temperature and pressure differences of the two waters are kept within adequate ranges. Areas of application of the analyzer are wide ranging i.a. from ships' discharge waters to waste waters of industrial processes. The first application of the analyzer is on board oil tankers to control the discharge process of bilge and ballast waters. The analyzer is the first that fully corresponds to the stringent regulations for oil content monitors by the International Maritime Organization (IMO). Pilot installations of the analyzer are made on industrial plants.

Paper Details

Date Published: 1 May 1986
PDF: 5 pages
Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.951999
Show Author Affiliations
P. Niemela, Technical Research Centre of Finland (Finland)
J. Jaatinen, SLO Group (Finland)

Published in SPIE Proceedings Vol. 0590:
Infrared Technology and Applications
Lionel R. Baker; Andre Masson, Editor(s)

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