Share Email Print

Proceedings Paper

Microcomputer Controlled MTF Measuring Equipment for Infra-red and Visible Wavelengths
Author(s): J. P. Chauveau; J. C. Perrin
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

An operational MTF measuring bench operating in both visible and infra-red regions is described. Measurements can be made at both room and climatic chamber temperatures. The basic mathematics for measuring the MTF from the edge spread function (ESF) or from the line spread function (LSF) are given. Optimal criteria for the measurement are derived taking into account the spatial sampling frequency and spectral resolution. The results obtained with standard lenses are compared with theoretical calculations. The microcomputer software has been optimized in order to give the result in form of graphs in a few seconds. If also provides options for measuring focal lengths or magnification, distortion, field curvature and transmission.

Paper Details

Date Published: 1 May 1986
PDF: 8 pages
Proc. SPIE 0590, Infrared Technology and Applications, (1 May 1986); doi: 10.1117/12.951977
Show Author Affiliations
J. P. Chauveau, Telecommunications Radio Telephoniques (France)
J. C. Perrin, Telecommunications Radio Telephoniques (France)

Published in SPIE Proceedings Vol. 0590:
Infrared Technology and Applications
Lionel R. Baker; Andre Masson, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?