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Proceedings Paper

Electro-Optical Detector Laser Susceptibility Testing
Author(s): Dennis L. McCormack; Billy D. Heady; David L. Haavig
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Paper Abstract

McDonnell Douglas Corporation is involved in programs to improve survivability of electro-optic sensor systems that can be exposed to laser irradiation, from sources such as range finders and designators. The most vulnerable system components are the detectors. The detector damage level thus determines the system susceptibility. The system's detector susceptibility is tested initially with the detectors separate from the sensor system hardware. The McDonnell Douglas High Energy Laser Test Facility (HELTF) used for testing detectors is located in St.Louis Mo. It includes 23 lasers, computer controlled data acquisition systems, and thermal-vacuum test chambers. This facility has been used to characterize detector laser susceptibility for 13 years. Photo-conductive and photo-voltaic detectors have been tested from visible to long wave infrared wavelengths. The HELTF facility and detector susceptibility test techniques, including beam mapping and ensquared energy measurement techniques, are described in detail. Detector damage mechanisms are also discussed.

Paper Details

Date Published: 30 June 1989
PDF: 10 pages
Proc. SPIE 1050, Infrared Systems and Components III, (30 June 1989); doi: 10.1117/12.951439
Show Author Affiliations
Dennis L. McCormack, McDonnell Douglas Corporation (United States)
Billy D. Heady, McDonnell Douglas Corporation (United States)
David L. Haavig, McDonnell Douglas Corporation (United States)

Published in SPIE Proceedings Vol. 1050:
Infrared Systems and Components III
Robert L. Caswell, Editor(s)

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