Share Email Print

Proceedings Paper

Trends In Scene Generation Technology: Calibration To Functional Testing
Author(s): Donald E. Parker; Don G. Taylor; C. T. Wallace Jr.
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Scene generation requirements are continually driven by increasingly complex threat and seeker/sensor hardware. Improvements in testing technology, which traditionally lag the development of new devices, have progressed significantly in recent years. The cost of extensive flight testing of surveillance and interceptor devices has given renewed interest to functional testing in a laboratory environment. Scene complexity has had to be greatly expanded to meet this need. Calibration curves are no longer sufficient to meet the growing needs of functional testing. This paper traces the historical development of LWIR sensor/seeker scene generation and projection technology. Electronic, all-digital and inband techniques are included.

Paper Details

Date Published: 30 June 1989
PDF: 7 pages
Proc. SPIE 1050, Infrared Systems and Components III, (30 June 1989); doi: 10.1117/12.951438
Show Author Affiliations
Donald E. Parker, USASDC (United States)
Don G. Taylor, Nichols Research Corporation (United States)
C. T. Wallace Jr., Nichols Research Corporation (United States)

Published in SPIE Proceedings Vol. 1050:
Infrared Systems and Components III
Robert L. Caswell, Editor(s)

© SPIE. Terms of Use
Back to Top