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Proceedings Paper

Absolute Measurements Of Diffuse Reflectance In The 0.8-5.5 µm Region
Author(s): D. Sheffer
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Paper Abstract

An absolute reflectometer for the 0.8-5.5μm region is described. It is based on integrating spheres, and utilizes the Third Taylor method in the 7°/d configuration. A new theory for the reduction of the data is presented, and results for some diffuse gold samples are given.

Paper Details

Date Published: 5 July 1989
PDF: 9 pages
Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); doi: 10.1117/12.951087
Show Author Affiliations
D. Sheffer, Israel Institute of Technology (Israel)

Published in SPIE Proceedings Vol. 1038:
6th Mtg in Israel on Optical Engineering
Rami Finkler; Joseph Shamir, Editor(s)

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