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Proceedings Paper

Mode Field Diameter -- Measurement in Far Field Pattern Method and Characteristics --
Author(s): Toru Myogadani; Shigeru Tanaka
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Paper Abstract

Measurement accuracy of mode field diameter (M.F.D.) by far field pattern method and the characteristics of M.F.D. in viewpoint of its definition are examined. It is found that M.F.D. by second moment definition becomes larger than that by gaussian fit defini-tion with a decrease in normalized frequency V.

Paper Details

Date Published: 15 April 1986
PDF: 7 pages
Proc. SPIE 0584, Optical Fiber Characteristics and Standards, (15 April 1986);
Show Author Affiliations
Toru Myogadani, Sumitomo Electric Industries, Ltd. (Japan)
Shigeru Tanaka, Sumitomo Electric Industries, Ltd. (Japan)

Published in SPIE Proceedings Vol. 0584:
Optical Fiber Characteristics and Standards
Remy Bouillie, Editor(s)

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