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Proceedings Paper

Prototype Development Of A Microcontroller Based Field Optical Density Tester
Author(s): Daniel R. Cote; L. David LaFleur; Victor E. Cappelli; Robert H. Clayton; Kenneth J. Bingman
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Paper Abstract

A portable spectrometer has been designed that measures the transmission of tank periscopes in the field. The purpose of the instrument is to measure optical density to 4.0 over the range from 380 to 1100nm with lnm resolution. A motorized monochromator scans the desired test band. Data is acquired by silicon photodiodes, amplified by a programmable gain amplifier (PGA) and processed using a 12-bit A/D converter. A chopped input beam removes background signal. Ratio detection between measurement and reference arms compensates for input light intensity variation. Innovations in optical, mechanical and signal processing design are described. The precision of measurements made at various wavelengths and angles of incidence is discussed.

Paper Details

Date Published: 1 May 1989
PDF: 8 pages
Proc. SPIE 1036, Precision Instrument Design, (1 May 1989); doi: 10.1117/12.950994
Show Author Affiliations
Daniel R. Cote, The Perkin-Elmer Corporation (United States)
L. David LaFleur, The Perkin-Elmer Corporation (United States)
Victor E. Cappelli, The Perkin-Elmer Corporation (United States)
Robert H. Clayton, The Perkin-Elmer Corporation (United States)
Kenneth J. Bingman, The Perkin-Elmer Corporation (United States)

Published in SPIE Proceedings Vol. 1036:
Precision Instrument Design
Thomas C. Bristow; Alson E. Hatheway, Editor(s)

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