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Proceedings Paper

Design Review Of A Complete Angle Scatter Instrument
Author(s): J. Rifkin; K. A. Klicker; D. R. Bjork; D. R. Cheever; T. F. Schiff; J. C. Stover; F. M. Cady; D. J. Wilson; P. D. Chausse; K. H. Kirchner
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Paper Abstract
An instrument has been designed and built to measure plane of incidence scatter at multiple wavelengths including .6328μm, from reflective, transmissive, specular, diffuse, flat and curved optics. An extensive software package accompanies the instrument and is used both to control the measurement process and to analyze the measurement data. Techniques employed in the design and development of this instrument are described. An error analysis for the measured BSDF is provided and calibration of the instrument is discussed.
Paper Details
Date Published: 1 May 1989
PDF: 9 pages
Proc. SPIE 1036, Precision Instrument Design, (1 May 1989); doi: 10.1117/12.950984
Show Author Affiliations
J. Rifkin, Toomay, Mathis & Associates, Inc. (United States)
K. A. Klicker, Toomay, Mathis & Associates, Inc. (United States)
D. R. Bjork, Toomay, Mathis & Associates, Inc. (United States)
D. R. Cheever, Toomay, Mathis & Associates, Inc. (United States)
T. F. Schiff, Toomay, Mathis & Associates, Inc. (United States)
J. C. Stover, Toomay, Mathis & Associates, Inc. (United States)
F. M. Cady, Toomay, Mathis & Associates, Inc. (United States)
D. J. Wilson, Toomay, Mathis & Associates, Inc. (United States)
P. D. Chausse, Toomay, Mathis & Associates, Inc. (United States)
K. H. Kirchner, Toomay, Mathis & Associates, Inc. (United States)

Published in SPIE Proceedings Vol. 1036:
Precision Instrument Design
Thomas C. Bristow; Alson E. Hatheway, Editor(s)
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